International Conference on Intelligent Education and Intelligent Research
Date: 9 November 2025 · Keywords: CTT, Rasch Model, Item Analysis, Test Equating
Workshop Fees
· Registered conference participants: Free
· Non-registered participants: USD 80 / CNY 500
For payment details and registration policy, please refer to the Conference Registration & Fees page.
The purpose of this workshop is to introduce two important aspects of language testing: CTT-based Item Analysis and Rasch-based Test Equating via the Rasch-GZ. This workshop fits the IEIR theme of applications in education and research.
The workshop falls into three parts:
As Rasch-GZ is highly incorporated with AI, participants needn’t possess particular psychometric competence. Users may choose the language for output files.
Guided onboarding with AI hints in the user-selected language: from installation to parameter interpretation.
No command files required; the only input is a properly formatted data file. If a file is not prepared correctly, the system provides textual or spoken guidance step by step until success.
Please bring your laptop to download the free student version for immediate use. Complimentary books will be distributed during the workshop.
For detailed features of Rasch-GZ, see doi.org/10.2991/978-94-6463-494-5-25 or visit www.rasch-gz.com.